JPH0619079Y2 - 自動分析装置における分光装置 - Google Patents

自動分析装置における分光装置

Info

Publication number
JPH0619079Y2
JPH0619079Y2 JP1988056737U JP5673788U JPH0619079Y2 JP H0619079 Y2 JPH0619079 Y2 JP H0619079Y2 JP 1988056737 U JP1988056737 U JP 1988056737U JP 5673788 U JP5673788 U JP 5673788U JP H0619079 Y2 JPH0619079 Y2 JP H0619079Y2
Authority
JP
Japan
Prior art keywords
light
measurement
diffraction grating
automatic analyzer
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988056737U
Other languages
English (en)
Japanese (ja)
Other versions
JPH01162648U (en]
Inventor
杉夫 間部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP1988056737U priority Critical patent/JPH0619079Y2/ja
Priority to US07/343,681 priority patent/US4950077A/en
Priority to DE3914135A priority patent/DE3914135A1/de
Publication of JPH01162648U publication Critical patent/JPH01162648U/ja
Application granted granted Critical
Publication of JPH0619079Y2 publication Critical patent/JPH0619079Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/04—Batch operation; multisample devices
    • G01N2201/0407—Batch operation; multisample devices with multiple optical units, e.g. one per sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/04—Batch operation; multisample devices
    • G01N2201/0415—Carrusel, sequential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/08—Optical fibres; light guides
    • G01N2201/0826—Fibre array at source, distributing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/08—Optical fibres; light guides
    • G01N2201/0833—Fibre array at detector, resolving

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
JP1988056737U 1988-04-28 1988-04-28 自動分析装置における分光装置 Expired - Lifetime JPH0619079Y2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1988056737U JPH0619079Y2 (ja) 1988-04-28 1988-04-28 自動分析装置における分光装置
US07/343,681 US4950077A (en) 1988-04-28 1989-04-27 Photoelectric measuring apparatus for use in automatic analyzer
DE3914135A DE3914135A1 (de) 1988-04-28 1989-04-28 Fotoelektrisches messgeraet zur verwendung in einem automatischen analysator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988056737U JPH0619079Y2 (ja) 1988-04-28 1988-04-28 自動分析装置における分光装置

Publications (2)

Publication Number Publication Date
JPH01162648U JPH01162648U (en]) 1989-11-13
JPH0619079Y2 true JPH0619079Y2 (ja) 1994-05-18

Family

ID=13035834

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988056737U Expired - Lifetime JPH0619079Y2 (ja) 1988-04-28 1988-04-28 自動分析装置における分光装置

Country Status (3)

Country Link
US (1) US4950077A (en])
JP (1) JPH0619079Y2 (en])
DE (1) DE3914135A1 (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008139954A1 (ja) * 2007-05-09 2008-11-20 Olympus Corporation 測光装置及び自動分析装置

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04348258A (ja) * 1991-05-27 1992-12-03 Kowa Co 多チャンネル光学測定装置
DE4118168A1 (de) * 1991-06-03 1993-01-21 Zeiss Carl Jena Gmbh Anordnung zur bestimmung von fett und eiweiss
DE4122925C2 (de) * 1991-07-11 1994-09-22 Fraunhofer Ges Forschung Optisches Spektrometer
US5317379A (en) * 1992-02-11 1994-05-31 Rosemount Analytical Inc. Chemical species optical analyzer with multiple fiber channels
AU5121900A (en) * 1999-03-12 2000-09-28 Ut-Battelle, Llc Integrated calorimetric spectrometer
US7315371B2 (en) * 2004-01-23 2008-01-01 P&P Optica Inc. Multi-channel spectrum analyzer
US7307718B2 (en) * 2004-02-23 2007-12-11 Ortho-Clinical Diagnostics, Inc. Determining an analyte by multiple measurements through a cuvette
US20050185176A1 (en) * 2004-02-23 2005-08-25 Moran Donald J.Jr. Determining an analyte by multiple measurements through a cuvette
EP2820429B1 (en) 2012-03-02 2021-02-24 LAXCO, Inc. Multichannel analytical instruments for use with specimen holders
JP6194592B2 (ja) 2013-02-22 2017-09-13 セイコーエプソン株式会社 分光カメラ
DE102014211240A1 (de) * 2014-06-12 2015-12-17 Carl Zeiss Microscopy Gmbh Spektrometrisches Messinstrument und Verfahren zur Kopplung spektrometrischer Messinstrumente
JPWO2018186448A1 (ja) 2017-04-04 2020-03-05 国立大学法人豊橋技術科学大学 多波長光照射装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI44171B (en]) * 1970-05-15 1971-06-01 Ollituote Oy
GB1392379A (en) * 1972-08-17 1975-04-30 Rank Organisation Ltd Analytical apparatus
DE2255300A1 (de) * 1972-11-11 1974-05-22 Siemens Ag Verfahren und geraet zur kolorimetrischen untersuchung von substanzen auf signifikante bestandteile
JPS5752882A (en) * 1980-09-16 1982-03-29 Sharp Corp Power source circuit
FR2519427A1 (fr) * 1982-01-04 1983-07-08 Instruments Sa Dispositif de spectrometrie
JPS5970946A (ja) * 1982-10-15 1984-04-21 Toshiba Corp 吸光度測定装置
JPS6332351A (ja) * 1986-07-26 1988-02-12 Hitachi Ltd 吸光光度計
JP2985980B2 (ja) * 1991-06-19 1999-12-06 日本化学工業株式会社 高純度ジアリールクロロホスフェートの製造方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008139954A1 (ja) * 2007-05-09 2008-11-20 Olympus Corporation 測光装置及び自動分析装置
US8064062B2 (en) 2007-05-09 2011-11-22 Beckman Coulter, Inc. Photometric apparatus and automatic analyzer
KR101126479B1 (ko) * 2007-05-09 2012-03-29 베크만 컬터, 인코포레이티드 측광 장치 및 자동 분석 장치

Also Published As

Publication number Publication date
US4950077A (en) 1990-08-21
DE3914135A1 (de) 1989-11-09
DE3914135C2 (en]) 1991-05-08
JPH01162648U (en]) 1989-11-13

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